The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2006

Filed:

Jan. 05, 2004
Applicants:

Akihiko Okumura, Hachioji, JP;

Izumi Waki, Tokyo, JP;

Inventors:

Akihiko Okumura, Hachioji, JP;

Izumi Waki, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a mass spectrometer combining an ion trap and a TOFMS non-coaxially, wherein ion trapping efficiency, mass resolution, and CID efficiency can be maximized. The present invention relates to the mass spectrometer combining the ion trap and the TOFMS non-coaxially, having a mass filter disposed between an ion source and an ion trap and a controller for controlling the gas pressure inside the ion trap and the gas pressure inside the mass filter independently, wherein the gas pressure inside the ion trap is set to the level higher than that inside the mass filter.


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Okumura, Akihiko. (2006). Mass spectrometer and method of use (U.S. Patent No. 7034287). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7034287

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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