The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2006

Filed:

Mar. 19, 2003
Applicants:

Frank N. Chang, Dresher, PA (US);

Phu T. Duong, Malvern, PA (US);

Inventors:

Frank N. Chang, Dresher, PA (US);

Phu T. Duong, Malvern, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/00 (2006.01); C12Q 1/34 (2006.01); C12Q 1/37 (2006.01); A61K 38/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to a method and a test kit for detecting cockroach allergens and/or determining the total allergen level. A sample from an environment in which cockroaches are present or are suspected to be present is provided. The sample and a substrate composition comprising a chitinase substrate are then contacted. The presence of cockroach allergens can be determined by observing or detecting the magnitude of a measurable change of a property of the substrate composition following the contact between the sample and the substrate composition wherein the magnitude of the measurable change of a property of the substrate composition is proportional to the total allergen level. The total allergen level can be determined by measuring the magnitude of the measurable change of a property of the substrate composition, or by comparing the magnitude with a reference standard.


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