The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2006

Filed:

Mar. 05, 2004
Applicants:

Jürgen Hertenberger, Aich, DE;

Sebastian Brandl, Altenmarkt, DE;

Inventors:

Jürgen Hertenberger, Aich, DE;

Sebastian Brandl, Altenmarkt, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for the production (mounting) of an angle measuring instrument, in which a graduation support, in the form of a flexible band having a scannable measuring graduation, is fixed on a support body, forming an annular portion, in such a way that the measuring graduation extends in a circumferential direction on an outer wall of an annular arrangement formed by the support body and the graduation support. The method includes fixing the graduation support on an inner annular wall of the support body and positioning the support body so that the support body only partly covers the graduation support in an axial direction.


Find Patent Forward Citations

Hertenberger, Jürgen. (2006). Angle measuring instrument and procedure for the production of the angle measuring instrument (U.S. Patent No. 7032317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7032317

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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