The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Mar. 18, 2003
Applicants:

Kazuhiro Watanabe, Kawasaki, JP;

Yuuichi Kubo, Kawasaki, JP;

Hideo Ishii, Kawasaki, JP;

Inventors:

Kazuhiro Watanabe, Kawasaki, JP;

Yuuichi Kubo, Kawasaki, JP;

Hideo Ishii, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method of production control that is preferably used for manufacture of electronic apparatus such as liquid crystal displays and provides a method of production control that makes it possible to set a feasible quantity to be processed. In a method of production control for a production line having a plurality of production steps, a tentative target quantity to be processed is set for a major production step; the tentative target quantity to be processed is set as a target quantity to be processed when the quantity of work in process that can be actually processed is equal to or greater than the tentative target quantity to be processed; and the quantity of work in process that can be processed is set as the target quantity to be processed when the quantity of work in process that can be processed is smaller than the tentative target quantity to be processed.


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