The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2006
Filed:
Jul. 17, 2001
Werner Kerzendorf, München, DE;
Thomas Köhler, München, DE;
Andreas Langmeier, München, DE;
Winfried Lohmiller, München, DE;
Werner Kerzendorf, München, DE;
Thomas Köhler, München, DE;
Andreas Langmeier, München, DE;
Winfried Lohmiller, München, DE;
Eads Deutschland GmbH, Munich, DE;
Abstract
Method for determining a state variable x from at least one sensor value by a cost function prepared for a measured value y for implementation in an arithmetic unit of a sensor system having at least one sensor and wherein the cost function depends on the respective state x to be measured and gives a deviation of an actual measured value from the calibration as a function of state x in order to determine the sought state x from this minimum. For the cost function, at least one approximation function is set up on the basis of at least one approximation region within the state region x, by which an approximation of the cost function is carried out with approximation functions with negligible error, wherein the sums of the approximation regions cover the entire relevant state region, and at least all local minima are determined on the basis of the approximation, in a selection of approximation regions, wherein optionally a global minimum is determined from the comparison of local minima.