The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2006
Filed:
Nov. 11, 2002
David E. Ritscher, Minneapolis, MN (US);
Shantanu Sarkar, St. Paul, MN (US);
David E. Ritscher, Minneapolis, MN (US);
Shantanu Sarkar, St. Paul, MN (US);
Medtronic, Inc, Minneapolis, MN (US);
Abstract
Detection of arrhythmias is facilitated using irregularity of ventricular beats measured by delta-RR (ΔRR) intervals that exhibit discriminatory signatures when plotted in a Lorenz scatter-plot. An 'AF signature metric' is established characteristic of episodes of AF that exhibit highly scattered (sparse) distributions or formations of 2-D data points. An 'AFL signature metric' is established characteristic of episodes of AFL that exhibit a highly concentrated (clustered) distribution or formation of 2-D data points. A set of heart beat interval data is quantified to generate highly scattered (sparse) formations as a first discrimination metric and highly concentrated (clustered) distributions or formations as a second discrimination metric. The first discrimination metric is compared to the AF signature metric, and/or the second discrimination metric is compared to the AFL signature metric. AF or HFL is declared if the first discrimination metric satisfies either one of the AF signature metric.