The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Mar. 09, 2004
Applicants:

Jianguo Wang, Cupertino, CA (US);

David Fong, Cupertino, CA (US);

Jack Zezhong Peng, San Jose, CA (US);

Fei YE, Cupertino, CA (US);

Michael David Fliesler, Santa Cruz, CA (US);

Inventors:

Jianguo Wang, Cupertino, CA (US);

David Fong, Cupertino, CA (US);

Jack Zezhong Peng, San Jose, CA (US);

Fei Ye, Cupertino, CA (US);

Michael David Fliesler, Santa Cruz, CA (US);

Assignee:

Kilopass Technology, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing the programmability of a memory cell is disclosed. The memory cell comprises a select transistor and a data storage element. The method comprises applying a test voltage across the data storage element. The select transistor is turned on. Finally, a current flow through the data storage element when the test voltage is applied is measured. A test positive signal is indicated if the current flow is greater than a reference.


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