The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

May. 21, 2001
Applicant:

Ravi Prakash, Concord, NC (US);

Inventor:

Ravi Prakash, Concord, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Defect and maintenance detection for an image capture device (ICD) capable of distinguishing between a defect in the ICD and one on the imaged object. The defect detection system includes, inter alia: a value combiner that combines a brightest image video value for each sensing element of the ICD experiencing the imaged object with a corresponding stored device video value to create a combined value for each image video value; and a defect determinator determines the presence of a defect(s) by comparing the combined values to a defect threshold. The maintenance detection system includes a determinator that determines when maintenance is required based on whether a single image is considered defective or whether a number of consecutive defective images have been created. Device video values are updated sluggishly according to corresponding image video values.


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