The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2006
Filed:
Oct. 28, 2003
Paul Yager, Seattle, WA (US);
Elain S. Fu, Seattle, WA (US);
Paul Yager, Seattle, WA (US);
Elain S. Fu, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
This invention provides methods, devices and device components for sensing, imaging and characterizing changes in the composition of a probe region. More particularly, the present invention provides methods and devices for detecting changes in the refractive index of a probe region positioned adjacent to a sensing surface, preferably a sensing surface comprising a thin conducting film supporting surface plasmon formation. In addition, the present invention provides methods and device for generating surface plasmons in a probe region and characterizing the composition of the probe region by generating one or more surface plasmon resonances curves and/or surface plasmon resonance images of the probe region.