The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Aug. 05, 2003
Applicants:

Thomas P. Allen, Allston, MA (US);

Neal R. Butler, Acton, MA (US);

Inventors:

Thomas P. Allen, Allston, MA (US);

Neal R. Butler, Acton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the invention is directed to methods and apparatus for determining a variation of a calibration parameter of a pixel of the thermal sensor during operation of the imaging apparatus, after an initial calibration procedure. Another embodiment of the invention is directed to methods and apparatus for calculating a gain calibration parameter using first and second ambient temperature values and respective first and second resistance values for a pixel of a sensor. A further embodiment of the invention is directed to calculating an offset calibration parameter for at least one pixel using a gain of the at least one pixel between first and second times and an ambient temperature at a third time, wherein the pixel is exposed to both scene and ambient radiation at the third time.


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