The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Nov. 18, 2003
Applicants:

Toshiyasu Matsuyama, Ohtsu, JP;

Kiyofumi Fukuda, Ohtsu, JP;

Yasuhiro Takada, Ohtsu, JP;

Inventors:

Toshiyasu Matsuyama, Ohtsu, JP;

Kiyofumi Fukuda, Ohtsu, JP;

Yasuhiro Takada, Ohtsu, JP;

Assignee:

Optex Co., Ltd., Shiga, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 9/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Sensor(s) may be such that light-projecting component(s) and light-receiving component(s) are arranged therein. Furthermore, such sensor(s) may be provided with optical path varying means for varying projected light optical path(s) and/or received light optical path(s) so as to physically vary overlapping zone(s) in which the projected light optical path(s) and the received light optical path(s) at least partially overlap. The optical path varying means may carry out adjustment of optical sensitivity by increasing the extent(s) of the overlapping zone(s) when carrying out detection with respect to zone(s) distant from such sensor(s) and/or decreasing the extent(s) of the overlapping zone(s) when carrying out detection with respect to zone(s) proximate to such sensor(s).


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