The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Jan. 14, 2003
Applicants:

Takashi Anazawa, Kodaira, JP;

Keiichi Nagai, Higashi-yamato, JP;

Inventors:

Takashi Anazawa, Kodaira, JP;

Keiichi Nagai, Higashi-yamato, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The electrophoresis apparatus has plural capillaries for separating fluorephore-labeled samples by electrophoresis, fluorescence detecting parts provided in a part of these capillaries arranged in the same plane for detecting fluorescence emitted by fluorephore labels when a part of the plural capillaries is scanned and irradiated by a laser beam, and a fluorescence detection system for detecting this fluorescence. The fluorescence detecting parts are scanned and repeatedly irradiated by the laser beam where a scanning period of the fluorescence detecting parts by the laser beam is t, and the fluorescence is detected by the fluorescence detecting system where an acquisition time of fluorescence signal is t(t≦t). The laser beam from a laser source is narrowly converged by a light collecting lens, and a galvanomirror is rotated in a rotation directional of the galvanomirror around the rotation axis of the galvanomirror so as to repeatedly scan the fluorescence detecting parts.


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