The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Oct. 27, 2004
Applicant:

Heinrich Feichtinger, Hinteregg, CH;

Inventor:

Heinrich Feichtinger, Hinteregg, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns a process for the measurement of the amount of a component that is released from a gaseous atmosphere during the thermo-chemical treatment of metallic work pieces. In order to provide a measurement system that offers the opportunity even in the ongoing treatment process for supplying the most exact data on the amount of a component released from the gaseous atmosphere and absorbed by the work piece a process is suggested with the invention for the continuous measurement of the amount of a component that is released from the gaseous atmosphere surrounding the work pieces and absorbed by the work pieces during a thermo-chemical treatment of metallic work pieces where a probe whose longitudinal extension significantly exceeds its width is exposed to the effect of the gaseous atmosphere, the longitudinal change of the probe over time in the longitudinal direction caused by the absorption of the component released by the gaseous atmosphere is measured and the measured longitudinal change is used for the determination of the amount of the transferred component transferred from the gaseous atmosphere to the probe.


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