The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Mar. 12, 2003
Applicants:

Masashi Masuda, Kawasaki, JP;

Akio Hara, Kawasaki, JP;

Kohji Kitagawa, Kawasaki, JP;

Inventors:

Masashi Masuda, Kawasaki, JP;

Akio Hara, Kawasaki, JP;

Kohji Kitagawa, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An internal bus testing device for a semiconductor integrated circuit in which an internal bus control circuit and a plurality of modules are linked by a plurality of internal buses. The internal bus testing device includes an area selector which causes the internal bus control circuit to select an address area corresponding to one of the plurality of internal buses. An area address setting unit sets the internal bus control circuit in an internal bus test mode in response to an internal bus test start signal, the area address setting unit storing a state setting signal and a predetermined address value indicating the address area. A control unit supplies, at a start of an internal bus test, the address value from the area address setting unit to the area selector by transmitting the state setting signal from the area address setting unit to the area selector.


Find Patent Forward Citations

Masuda, Masashi. (2006). Internal bus testing device and method (U.S. Patent No. 7028237). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7028237

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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