The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Sep. 27, 2002
Patrick J. Smith, Houston, TX (US);
Ruben D. Perez, Sugarland, TX (US);
Patrick J. Smith, Houston, TX (US);
Ruben D. Perez, Sugarland, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
In digital signal processors serial data is passed in out and of the chip in a time division multiplexed (TDM) fashion. The TDM stream consists of many independent channels of serial data. The complexity of generating interleaved TDM serial data from multiple sources particularly in the case of multi-processor systems. This process is normally driven by a program resident on each processor. The proper sequencing of the TDM serial stream must be tested prior to making the multi-processor device ready for its application. This invention describes the use of minimal added hardware and a single output pin allowing the test and debug of program errors or device malfunctions in output serial data.