The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Nov. 16, 2001
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
Sun Microsystems, Inc, Santa Clara, CA (US);
Abstract
One embodiment of the present invention provides a system that solves an unconstrained interval global optimization problem specified by a function ƒ, wherein ƒ is a scalar function of a vector x=(x, x, x, . . . x). The system operates by receiving a representation of the function ƒ, and then performing an interval global optimization process to compute guaranteed bounds on a globally minimum value ƒ* of the function ƒ(x) and the location or locations x* of the global minimum. While performing the interval global optimization process, the system deletes all of part of a subbox X for which ƒ(x)>ƒ_bar, wherein ƒ_bar is the least upper bound on ƒ* that has been so far found. This is called the 'ƒ_bar test'. The system applies term consistency to the ƒ_bar test over the subbox X to increase that portion of the subbox X that can be proved to violate the ƒ_bar test.