The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7027941 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 11, 2006

Filed:

Jun. 07, 2005
Applicants:

Kenji Nagase, Kawasaki, JP;

Takashi Yamagajo, Kawasaki, JP;

Shinichi Ohtsu, Kawasaki, JP;

Inventors:

Kenji Nagase, Kawasaki, JP;

Takashi Yamagajo, Kawasaki, JP;

Shinichi Ohtsu, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to improve the speed of an electro-magnetic field intensity calculation process in a device capable of performing the cooperation process of a circuit analysis and an electro-magnetic wave analysis, the present invention comprises a determination unitfor determining whether a component constituting an electric circuit contained in an analysis target, an analysis processing unitfor analyzing an electro-magnetic wave emitted from the analysis target, using an analysis target model containing a linear component if all components are linear, and a cooperation process unitfor dividing the analysis target into a circuit analysis model to which a circuit analysis method should be applied, an electro-magnetic wave analysis model to which an electro-magnetic wave analysis should be applied and one or more ports for combining the two models and analyzing an electro-magnetic wave emitted from the analysis target, if one or more components are non-linear.


Find Patent Forward Citations

Nagase, Kenji. (2006). Device and method for calculating electro-magnetic field intensity by cooperation of circuit analyses and electro-magnetic wave analyses (U.S. Patent No. 7027941). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7027941

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