The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7027730 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 11, 2006

Filed:

Nov. 07, 2002
Applicants:

Akira Nagayama, Sapporo, JP;

Kazuyoshi Shimizu, Sapporo, JP;

Inventors:

Akira Nagayama, Sapporo, JP;

Kazuyoshi Shimizu, Sapporo, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method for measuring transmission loss in an optical transmission line between a master station and a slave station, and also a slave station, a master station and a star network communication system using this method. Power of an optical signal is measured at a second end of an optical transmission line connected with an added slave station and at a first end other than the second end. The result at the first end is stored in a storing unit or transmitted to an incorporating unit by a transferring unit. The incorporating unit incorporates the result into a downstream optical signal, which is transmitted to the slave station. In the slave station an information extracting unit extracts the result from the downstream optical signal, and a processing unit calculates a difference between the measurement results of the first and second ends to obtain transmission loss therebetween.


Find Patent Forward Citations

Nagayama, Akira. (2006). Method for measuring transmission loss in optical transmission line for test, and slave station, master station, and optical communication system using the method (U.S. Patent No. 7027730). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7027730

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