The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Oct. 01, 2002
Applicants:

Peter Rudak, Hilton, NY (US);

Yongchun Lee, Rochester, NY (US);

Thomas J. Morgan, Fairport, NY (US);

Inventors:

Peter Rudak, Hilton, NY (US);

Yongchun Lee, Rochester, NY (US);

Thomas J. Morgan, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining skew angle () and location of a document in an over-scanned digital image is disclosed. A document is scanned to capture a gray scale image. The outline pixel () of a document from the captured gray scale image are connected (). An initial angle is set at zero and a x-minimum, y-minimum, x-maximum, and y-maximum of the polygon are determined (). A rectangular boundary () area based on the x-minimum, y-minimum, x-maximum, and y-maximum is calculated and recorded. The angle is recorded and the polygon is rotated z-degree. The process is repeated and a minimum boundary area is selected. An angle corresponding to the minimum boundary is the skew angle of the document.


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