The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Nov. 29, 2001
Applicants:

David J. Foran, Short Hills, NJ (US);

Dorin Cominciu, Highland Park, NJ (US);

Peter Meer, East Brunswick, NJ (US);

Inventors:

David J. Foran, Short Hills, NJ (US);

Dorin Cominciu, Highland Park, NJ (US);

Peter Meer, East Brunswick, NJ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The systems described herein include tools for computer-assisted evaluation of objective characteristics of pathologies. A diagnostic system arranged according to the teachings herein provides computer support for those tasks well suited to objective analysis, along with human decision making where substantial discretion is involved. Collaborative diagnosis may be provided through shared access to data and shared control over a diagnostic tool, such as a telemicroscope, and messaging service for clinicians who may be at remote locations. These aspects of the system, when working in cooperation with one another, may achieve improved diagnostic accuracy or early detection for pathologies such as lymphoma.


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