The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Jun. 22, 2001
Anant Sahai, San Mateo, CA (US);
John Tsitsiklis, Lexington, MA (US);
Stefano Casadei, San Francisco, CA (US);
Andrew Chou, San Mateo, CA (US);
Benjamin Van Roy, San Mateo, CA (US);
Jesse Robert Stone, Palo Alto, CA (US);
Anant Sahai, San Mateo, CA (US);
John Tsitsiklis, Lexington, MA (US);
Stefano Casadei, San Francisco, CA (US);
Andrew Chou, San Mateo, CA (US);
Benjamin Van Roy, San Mateo, CA (US);
Jesse Robert Stone, Palo Alto, CA (US);
SiRF Technology, Inc., San Jose, CA (US);
Abstract
Techniques are provided for fine-tuning estimates of a delay value for a sampled signal. One aspect of the invention is to perform, for the sampled signal, coarse-grained calculations of the In Phase and Quadrature (I and Q) correlation integrals at a limited number of points, wherein the calculations are performed over a range of hypothesized delay values. A range of delay values of interest are then determined from the coarse-grained calculations of the I and Q correlation integrals. A subset of I and Q values based on the coarse granularity calculations of the I and Q correlation functions is used to perform a time-domain interpolation to obtain fine-grained values of the I and Q integrals in the range of the delay values of interest. Magnitude calculations are performed based on the fine-grained values of the I and Q integrals. Fine-tuned estimates of delay value are based on the magnitude calculations. Alternatively, fine-tuned estimates of delay value are based on the template-matching approach.