The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Aug. 15, 2005
Applicants:
Kam C. Lau, Potomac, MD (US);
Yuanqun Liu, N. Potomac, MD (US);
Inventors:
Kam C. Lau, Potomac, MD (US);
Yuanqun Liu, N. Potomac, MD (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical measurement system increases the number of translational and angular measurements made with a single laser beam by combining an optical interferometer with an optical autocollimator. Translational measurements are made with an optical interferometer and yaw and pitch measurements are made with an autocollimator. In a preferred embodiment, angular deviations in the reflected measuring beam are minimized with a reverse telescopic lens assembly, allowing a wider range of angular measurements without significant degradation of interferometer accuracy.