The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Jun. 24, 2004
Steven F. Rice, Oakland, CA (US);
Mark D. Allendorf, Fremont, CA (US);
Steven F. Rice, Oakland, CA (US);
Mark D. Allendorf, Fremont, CA (US);
Sandia National Laboratories, Livermore, CA (US);
Abstract
Corrosion of refractory silica brick and air quality issues due to particulate emissions are two important glass manufacturing issues that have been tied to sodium vapor and its transport throughout the melt tank. Knowledge of the relationship between tank operating conditions and tank atmosphere sodium levels are therefore important considerations in correcting corrosion and air quality issues. However, until recently direct quantitative measurements of sodium levels has been limited to extractive sampling methods followed by laboratory analysis. Excimer laser induced fragmentation (ELIF) fluorescence spectroscopy is a technique that permits the measurement of volatilized NaOH in high temperature environments on a timescale of less than one second. The development of this method and the construction of field-portable instrumentation for glass furnace applications are herein disclosed. The method is shown to be effective in full-scale industrial settings. Characteristics of the method are outlined, including equipment configuration, detection sensitivity, and calibration methodology.