The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Mar. 16, 2001
Applicants:

Toyoo Iida, Kyoto, JP;

Masanori Sato, Kyoto, JP;

Tomoki Ishizawa, Kyoto, JP;

Hitoshi Oba, Kyoto, JP;

Inventors:

Toyoo Iida, Kyoto, JP;

Masanori Sato, Kyoto, JP;

Tomoki Ishizawa, Kyoto, JP;

Hitoshi Oba, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image recording system includes first imaging means for imaging operations of manufacturing equipment in a production line, second imaging means arranged downstream from the manufacturing equipment for imaging articles processed by the manufacturing equipment, inspection means for inspecting the processed articles based on image data outputted from the second imaging means, and an image recording apparatus for acquiring data outputted from the first imaging means and the inspection means, wherein the image recording apparatus is equipped with a temporary storage portion for temporarily storing image data from the imaging means, storage means, and control means for reading out any desired interval from the image data stored a prescribed time interval portion in the past in the temporary storage portion and storing such read out interval when a signal based on inspection results outputted from the inspection means is received.


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