The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

May. 25, 2004
Applicants:

Kazuaki Takanuki, Tokyo, JP;

Masaaki Kaneko, Tokyo, JP;

Osamu Harakawa, Tokyo, JP;

Inventors:

Kazuaki Takanuki, Tokyo, JP;

Masaaki Kaneko, Tokyo, JP;

Osamu Harakawa, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a method of, and a device for, detecting smear of a magnetic head, in which detection of smear development before magnetic head assembly is made possible by measuring electrical resistance values between pads and shields of a slider that is integrated with a head main body portion, and in addition, throughput increases. The method of detecting smear of a magnetic head includes measuring electrical resistance values between pads of a slider having an integrated head main body portion, or between the pads and a conductor portion that is connected to a shield of the head main body portion to thereby detect smear development.


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