The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Sep. 24, 2003
Applicants:

Kelly Alan Stonger, Waukesha, WI (US);

John Jay Williams, Hartland, WI (US);

Inventors:

Kelly Alan Stonger, Waukesha, WI (US);

John Jay Williams, Hartland, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/164 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a system and method for generating a detector position map for an array of detectors. The detector position map comprises a map which converts measured position coordinates from a detection event to the detector in the array which detected the detection event. The method comprises the steps of illuminating an array of detectors with a source of radiation to generate a histogram, the histogram comprising an event count as a function of two dimensions, the two dimensions corresponding to a face of the array of detectors, wherein the histogram comprises a plurality of first peaks; modifying the histogram to comprise a plurality of second peaks, wherein the second peaks have a greater degree of isolation from each other than the first peaks; and for each detector, determining a region on the detector position map which corresponds to the detector, each region being based on a position of one of the second peaks.


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