The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Dec. 02, 2004
Applicants:

Kenji Ishii, Tokyo, JP;

Hitoshi Okazaki, Tokyo, JP;

Mitsuteru Kondo, Tokyo, JP;

Masaaki Takasuka, Tokyo, JP;

Motoharu Takeuchi, Tokyo, JP;

Inventors:

Kenji Ishii, Tokyo, JP;

Hitoshi Okazaki, Tokyo, JP;

Mitsuteru Kondo, Tokyo, JP;

Masaaki Takasuka, Tokyo, JP;

Motoharu Takeuchi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07C 321/12 (2006.01); C07C 325/02 (2006.01); C08G 75/02 (2006.01); C08G 75/14 (2006.01); C08F 2/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A composition containing 3,3'-thiobis(propane-1,2-dithiol) and one or more enic compounds which composition is photocurable and can give a cured product having a high refractive index and adequate hardness.


Find Patent Forward Citations

Ishii, Kenji. (2006). Enic compounds, sulfur-containing polyenic compound, sulfur-containing polythiol compound, high refractive index photocurable composition and cured product thereof (U.S. Patent No. 7026372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7026372

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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