The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Nov. 30, 1995
Applicants:

Anthony D. Barone, Santa Clara, CA (US);

Glenn H. MC Gall, Mountain View, CA (US);

Evelyn Chai, Foster City, CA (US);

Nam Quoc Ngo, Campbell, CA (US);

Inventors:

Anthony D. Barone, Santa Clara, CA (US);

Glenn H. Mc Gall, Mountain View, CA (US);

Evelyn Chai, Foster City, CA (US);

Nam Quoc Ngo, Campbell, CA (US);

Assignee:

Affymetrix, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 33/543 (2006.01); A61K 38/00 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

VLSIPS™ manufacturing processes are of increasing commercial importance. The present invention provides methods and compositions for monitoring the efficiency and quality of polymer synthesis in VLSIPS™ arrays. Methods for monitoring polymer synthesis in an array on a substrate are provided. Monoisomeric labels for the labeling of synthetic polymer arrays are provided. Methods and compositions for post-synthetically labeling polymers in polymer arrays are also provided.


Find Patent Forward Citations

Loading…