The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Jul. 10, 1998
Applicant:

Edward F. Helinski, Johnson City, NY (US);

Inventor:

Edward F. Helinski, Johnson City, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B26F 1/14 (2006.01); B23Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A punch and die alignment system. A first die includes a first die aperture for receiving a punch. A second die includes a second die aperture for receiving the punch. A first housing includes a first die-receiving passage for receiving at least a portion of the first die. A second housing includes a second die-receiving passage for receiving at least a portion of at least one of the second die and the first die and for permitting at least one of the first die and the second die to rotate therein, thereby permitting the first die aperture and the second die aperture to be aligned with each other.


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