The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Dec. 03, 2003
Dae Gab Gweon, Daejeon, KR;
Dong Min Kim, Daejeon, KR;
Jong Yeop Shim, Daejeon, KR;
Ki Hyun Kim, Daejeon, KR;
Dae Gab Gweon, Daejeon, KR;
Dong Min Kim, Daejeon, KR;
Jong Yeop Shim, Daejeon, KR;
Ki Hyun Kim, Daejeon, KR;
Abstract
A 3-axis straight-line motion stage and a sample test device using the same for supporting a predetermined sample, and comprising X-axis, Y-axis and Z-axis stages for moving the sample independently and precisely in the direction of the X-axis, the Y-axis or the Z-axis of rectangular coordinates. The 3-axis straight-line motion stage comprises a bottom platehaving a predetermined area and thickness; a X-axis stagefixed in a reference area RR of the bottom platefor moving in the direction of the X-axis a first X area RXpositioned from the reference RR to the direction of the X-axis; a Y-axis stagepositioned within the first X area RXand fixed in a second X area RXwhich is located within the first X area RXfor moving in the direction of the Y-axis a second Y area RYpositioned from the second X area to the direction of the Y-axis; and a Z-axis stagefixed in the second Y area RYwhich is located within the first Y area RYand supporting a predetermined sample for moving the sample in the direction of the Z-axis.