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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7024641 B1

PDFFull Text
Date of Patent:
Apr. 04, 2006

Filed:

Apr. 10, 2002

Integrated circuit having a programmable gate array and a field programmable gate array and methods of designing and manufacturing the same using testing ic before configuring fpga

Applicant:

Daniel R. Watkins, Saratoga, CA (US);

Inventor:

Daniel R. Watkins, Saratoga, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:

Hitt Gaines PC

Primary Examiner:

Thuan Do

Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an integrated circuit (IC). In one embodiment, the IC includes a substrate and a plurality of gate array blocks located on the substrate. Each of the blocks includes a programmable gate array (PGA) containing at least a portion of a circuit design in an interconnect layer thereof, and a field-programmable gate array (FPGA) coupled to the PGA and capable of containing a configuration that augments the portion of the circuit design. In this embodiment, the PGA and the FPGA cooperate to effect the circuit design. In another aspect, the present invention provides a method of designing an IC. In yet another aspect, the present invention provides a method of manufacturing ICs.

Find Patent Forward Citations

Watkins, Daniel. (2006). Integrated circuit having a programmable gate array and a field programmable gate array and methods of designing and manufacturing the same using testing ic before configuring fpga (U.S. Patent No. 7024641). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7024641

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