The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2006

Filed:

Feb. 19, 2002
Applicants:

Douglas R. Manley, Fort Collins, CO (US);

Lee A. Barford, San Jose, CA (US);

Inventors:

Douglas R. Manley, Fort Collins, CO (US);

Lee A. Barford, San Jose, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for diagnosing faults in a system under test (SUT) are provided. A representative method includes identifying at least some portions of the data transmission paths of the SUT capable of introducing errors in data transfer; providing constraints defining relationships of at least some of the portions of the data transmission paths; and diagnosing the SUT with respect to the constraints. Systems, computer-readable media and other methods also are provided.


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