The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2006

Filed:

Feb. 09, 2005
Applicant:

Martin Annis, Cambridge, MA (US);

Inventor:

Martin Annis, Cambridge, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01); H01J 35/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Laminography system with x-ray source and a detector assembly. The x-ray source uses a narrow, deflected pencil beam to scan to a linear target. An x-ray cone beam detected by the detector assembly is produced where the electron beam strikes the target. The target is a layer of high-emitting material that is partitioned with narrow regions of low-emitting material, where the low flux intensity is sufficiently low to be easily distinguished from the flux intensity of the high-emitting material. The target may be constructed as a discontinuous layer of high-emitting material applied to a substrate of low-emitting material, or as strips of low-emitting material applied to a continuous layer of high-emitting material.


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