The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Jul. 14, 2004
Nobuaki Kitajima, Tokyo, JP;
Nobuaki Kitajima, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
There are provided an operation microscope and an observation prism which are capable of conducting a high-visibility observation with less glare. The operation microscope includes an objective lens opposed to an eye to be operated, a front lens which is provided between the eye to be operated and an anterior focal point of the objective lens and condenses illumination light to illuminate an interior of the eye to be operated, and the observation prism disposed near the front lens to observe fundus and its surroundings of the eye to be operated. An oblique surface (refractive surface) of the observation prism has a curved shape in which the curved shape shows a certain negative curvature in a direction to an intersection with a refractive surface. Therefore, aberrations caused on images of entrance pupils of an observation system and an image of an exit pupil of an illumination system can be corrected. The images of the entrance pupils and the image of the exit pupil are sufficiently separated from one another on a cornea of the eye to be operated, so that an observation with less glare can be conducted.