The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7023561 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 04, 2006

Filed:

Jul. 17, 2003
Applicants:

Osamu Kakuchi, Utsunomiya, JP;

Eiichi Murakami, Utsunomiya, JP;

Inventors:

Osamu Kakuchi, Utsunomiya, JP;

Eiichi Murakami, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A projection exposure apparatus includes an exposure light source, an illumination system for illuminating a pattern, formed on a first object, with light from the exposure light source, a projection optical system for projecting a pattern, as illuminated with the light, onto a second object, and an interferometer for use in measurement of an optical characteristic of the projection optical system, wherein the interferometer is operable to perform the measurement by use of light from the exposure light source.


Find Patent Forward Citations

Kakuchi, Osamu. (2006). Exposure apparatus with interferometer (U.S. Patent No. 7023561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7023561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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