The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Jul. 11, 2002
Mark Adrian Vincent Chapman, Wotton-under-Edge, GB;
David Roberts Mcmurtry, Stancombe, GB;
Benjamin Roller Taylor, Stone, GB;
Mark Adrian Vincent Chapman, Wotton-under-Edge, GB;
David Roberts McMurtry, Stancombe, GB;
Benjamin Roller Taylor, Stone, GB;
Renishaw PLC, Gloucestershire, GB;
Abstract
Apparatus for aligning an optical measuring system to a desired direction comprises two housings () attachable to two relatively movable parts of a machine. The housings () have engagement means () such that when they are engaged together the optics inside () are aligned. The first housing () may be provided with attachment means, such as a ball (), which may be located in a mount () on the machine table (). The position of this ball () is determined and the machine spindle housing () to be attached to the spindle () when the two housings () are joined and such that the apparatus is aligned with the desired direction. The engagement means () between the two housings () may be compliant along an axis of the apparatus.