The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2006

Filed:

Aug. 23, 1999
Applicants:

Robert B. Havekost, Elgin, TX (US);

Larry Oscar Jundt, Round Rock, TX (US);

Roy Faltesek, Round Rock, TX (US);

Ian James Nadas, Austin, TX (US);

Inventors:

Robert B. Havekost, Elgin, TX (US);

Larry Oscar Jundt, Round Rock, TX (US);

Roy Faltesek, Round Rock, TX (US);

Ian James Nadas, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for the integrated display of process events and trend data. The method and apparatus provide for a unified display of trend data and process events related to the control and/or monitoring of a manufacturing process. A workstation generates and displays a trend chart that represents values of one or more selected process parameters during a selected time window. The workstation also generates and displays an event table containing information describing process events that are related to the selected process parameters and that occurred during the selected time window.


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