The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Aug. 06, 2002
Satoru Tomita, Singapore, SG;
Satoru Tomita, Singapore, SG;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuitand a row electrode driver circuitlike in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental capacitorsand a second measuring step of implementing writing in/reading out of the test video signals to and from a video buswhile rendering TFTsof a pixel sectionand analog switchesof the row electrode driver circuitto be held turned off. Obtaining a difference between a measured result of the first measuring step and a measured result of the second measuring step allows only a pixel component and a row electrode component with no driver component to be derived, whereupon discrimination is implemented for the presence of or the absence of electric defects in the pixel section.