The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Aug. 03, 2004
Dennis C. Leiner, Cape Elizabeth, ME (US);
Michael Bush, South Portland, ME (US);
Dennis C. Leiner, Cape Elizabeth, ME (US);
Michael Bush, South Portland, ME (US);
Lighthouse Imaging Corporation, Portland, ME (US);
Abstract
The invention uses optics and precision mechanisms to quantitatively assess the performance of medical endoscopes. By viewing standardized optical targets under well-controlled conditions, the optical quality of endoscopes can be easily determined in much the same fashion as getting one's eyes tested at the optometrist. The actual design, however, is much more complicated than your optometrist's eye chart and different types of endoscopes from different manufacturers require customization of the target geometry, the viewing distance, and the viewing angle. Also, there are several optical characteristics beyond image sharpness that need to be assessed, requiring other unique test geometries, including contrast, distortion, and vignetting. Clinically significant measurements are performed with simplicity and cost-effectiveness through the use of relatively inexpensive optical components and an embedded processor and graphical display system.