The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Oct. 29, 2001
James M. Byrd, Fremont, CA (US);
James M. Byrd, Fremont, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method of testing error correction/detection logic may involve providing each of a set of n data bit combinations to the error correction/detection logic. Each data bit combination has n bits, and the n data bit combinations may be created by creating an initial data bit combination whose data bits have the same logical value and then shifting a bit having the opposite value across the initial data bit combination. In response to being provided with the n data bit combinations, the error correction/detection logic generates a set of check bits for each of the n data bit combinations. The set of check bits generated by the error correction/detection logic for each of the n data bit combinations may then be verified.