The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Dec. 19, 2001
Weiqiang Zhang, San Jose, CA (US);
Konstantin I. Boudnik, Santa Clara, CA (US);
Weiqiang Zhang, San Jose, CA (US);
Konstantin I. Boudnik, Santa Clara, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A system for analyzing test result data from a plurality of test systems capable of producing the test result data in disparate formats is provided. The system includes a data processing block, a memory data structure, and a database. The data processing block is designed to receive the test result data in the disparate formats so as to produce an identifiable result data. The memory data structure is designed to store the identifiable result data in a table format. The database stores the identifiable result data obtained from the memory data structure. The identifiable result data has a uniform format for analyzing the test result data from the plurality of test systems.