The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Nov. 14, 2003
Applicants:

Joseph V. Miseli, San Bruno, CA (US);

Eric Boucher, Mountain View, CA (US);

Inventors:

Joseph V. Miseli, San Bruno, CA (US);

Eric Boucher, Mountain View, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 15/00 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention provides a system that tests the motion performance of an electronic display system, wherein the electronic display system includes a display, graphics processing software, graphics processing circuitry, and an interface coupling the display and the graphics processing circuitry. The system starts by receiving a request to measure an amount of distortion of an object in motion. In response to the request, the system measures the amount of distortion of the object in motion. In a variation on this embodiment, measuring the amount of distortion of the object in motion involves placing a ruler on a boundary of the object where the distortion occurs, increasing the width of the ruler until it covers the distortion, and then measuring the width to determine the size of the distortion.


Find Patent Forward Citations

Loading…