The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Aug. 13, 2004
Darvin Dale Raph, Loveland, CO (US);
Darvin Dale Raph, Loveland, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Methods for collecting and displaying conditional dependent test results. At least one measurement condition is received. The received measurement condition specifies the measurement environment. A result is received from at least one measurement. For each received result, each received measurement condition is associated with the received result, a new row in a table is selected, the received result is recorded in a specified result column in the new row, a separate column is associated with each received measurement condition, and each associated received measurement condition is recorded in its associated column in the new row. A change to the measurement environment is received, wherein the change includes at least one of the following: (1) a modification of at least one measurement condition, (2) an omission of at least one measurement condition, and (3) the addition of at least one new measurement condition. Appropriate steps are then repeated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile