The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Oct. 28, 2003
Alex Fishman, Sunnyvale, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Robert Lee Fennelly, San Jose, CA (US);
Andreas Weber, Los Altos, CA (US);
Subra Nagarajan, Livermore, CA (US);
Alex Fishman, Sunnyvale, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Robert Lee Fennelly, San Jose, CA (US);
Andreas Weber, Los Altos, CA (US);
Subra Nagarajan, Livermore, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to measure a signal propagation delay through an object connected to an optoelectronic device. The present invention includes determining for how long after a specific bit or bit group is transmitted by an optical transceiver the bit or bit group is received at the other end of the object connected to the optical transceiver.