The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Mar. 10, 2004
Applicants:

Thomas E. Nelson, Knoxville, TN (US);

Michael D. Rich, Powell, TN (US);

Vern W. Lowry, Ii, Knoxville, TN (US);

Arthur R. Crawford, West Jefferson, OH (US);

Robert Skeirik, Knoxville, TN (US);

Inventors:

Thomas E. Nelson, Knoxville, TN (US);

Michael D. Rich, Powell, TN (US);

Vern W. Lowry, II, Knoxville, TN (US);

Arthur R. Crawford, West Jefferson, OH (US);

Robert Skeirik, Knoxville, TN (US);

Assignee:

CSI Technology, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is an apparatus for detecting machine parameters including vibration, producing signal corresponding to the parameters and conditioning the signals by means of predetermined criteria such as amplitude and time criteria. Routes may be input to the analyzer with settings that govern part of the conditioning for individual machines. The predetermined criteria also may include an input limit criterion which ensures the safety of the analyzer circuitry by indicating attenuation levels for incoming signals. The analyzer is also capable of two channel analysis of input signals including a summing analysis. The analyzer has thumb operated controls for easy operation in harsh environments.


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