The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Feb. 21, 2002
Applicant:
Christopher Ludeman, Palm Bay, FL (US);
Inventor:
Christopher Ludeman, Palm Bay, FL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for internally testing portions of a subscriber loop interface circuit. Testing may be conducted on a semiconductor circuit including the subscriber loop interface circuit. The portion of the subscriber loop interface circuit being tested may be the ring trip detector and/or the off-hook detect circuit. Testing may be conducted without disabling the capability of the subscriber loop interface circuit to monitor the hook status of a subscriber.
Ludeman, Christopher. (2006). Apparatus and method for testing subscriber loop interface circuits (U.S. Patent No. 7020248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7020248
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile