The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Sep. 21, 2002
Knut Beneke, Ober-Olm, DE;
Joerg Nittikowski, Hohenstein-Holzhausen, DE;
Dirk Naumann, Lorsch, DE;
Hermann Ries, Taunusstein, DE;
Uwe Siedenburg, Essenheim, DE;
Claus Meder, Rossdorf, DE;
Stefan Ullrich, Saarbruecken-Klarenthal, DE;
Knut Beneke, Ober-Olm, DE;
Joerg Nittikowski, Hohenstein-Holzhausen, DE;
Dirk Naumann, Lorsch, DE;
Hermann Ries, Taunusstein, DE;
Uwe Siedenburg, Essenheim, DE;
Claus Meder, Rossdorf, DE;
Stefan Ullrich, Saarbruecken-Klarenthal, DE;
Heimann Systems GmbH, Wiesbaden, DE;
Abstract
A method for the detection of a specific material in an object (), especially in a piece of luggage, using electromagnetic beams, whereby the intensities of non-absorbed beams from at least three beam planes () in corresponding detector arrays () are measured and evaluated, using the following steps according to the invention: 1. generating an at least two-dimensional picture of the object () from the measured intensity values; 2. selecting one of the spatial regions displayed in the picture as a basis of the value of a material value, which is determined from intensity measurements, for examination; 3. determining at least one spatial-geometric value in the region to the examined from positional data of a two-dimensional picture and from intensity values using a stored value of a specific, absorption-influenced value of a suspected material. 4. determining, in addition, the corresponding spatial-geometric value solely from three-dimensional geometric values, which are determined from measured intensity values; and 5. comparing, directly or indirectly, values of the spatial-geometric values determined in steps 3 and 4, or values derived therefrom, in order to determine if the suspected material is actually present.