The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Aug. 29, 2003
Applicants:

Joachim Hornegger, Baiersdorf, DE;

Siegfried Schneider, Bamberg, DE;

Inventors:

Joachim Hornegger, Baiersdorf, DE;

Siegfried Schneider, Bamberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for generating a volume dataset of a subject with a first X-ray system having an X-ray source and an X-ray receiver and with a second X-ray system having an X-ray source and an X-ray receiver, the first X-ray system is rotated around an axis and sweeps a first angular range. Substantially simultaneously, a second series of 2D projections of the subject is acquired with the second X-ray system at projection angles differing from one another, by the second X-ray system being rotated around an axis and sweeping a second angular range differing from the first angular range. A volume dataset of the subject is generated from the first and second series of 2D projections of the subject acquired by the two X-ray systems.


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