The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Oct. 31, 2001
Applicants:

Tae-kyung Kim, Seoul, KR;

Young-man Ahn, Gyeonggi-do, KR;

Hae-jung Suh, Gyeonggi-do, KR;

Chong-sam Chung, Gyeonggi-do, KR;

Inventors:

Tae-kyung Kim, Seoul, KR;

Young-man Ahn, Gyeonggi-do, KR;

Hae-jung Suh, Gyeonggi-do, KR;

Chong-sam Chung, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/095 (2006.01); G11B 7/135 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical pickup is provided for a recording medium, including: a light source generating and emitting a light beam; a light beam division and detection unit dividing a particular light beam portion of the light beam after being reflected/diffracted from the recording medium into sub-divided light beams portions, and detecting the sub-divided light beam portions; and a spherical aberration detection circuit processing the sub-divided light beam portions to detect spherical aberration caused by thickness variation of the recording medium.


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