The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Mar. 15, 2004
Takashi Yamanishi, Hachioji, JP;
Hisashi Masago, Hachioji, JP;
Takashi Yamanishi, Hachioji, JP;
Hisashi Masago, Hachioji, JP;
Jasco Corporation, Tokyo, JP;
Abstract
A depth measuring apparatus is disclosed that comprises a mover for moving in an optical axis direction an objective lens for condensing a parallel light beam from a light emitter onto a measurement spot of a sample and converting light from the measurement spot to a parallel light beam, image forming lens for projecting light from the measurement spot obtained via the objective lens, aperture for passing only light from the focal point position of the objective lens, a surface scattered light information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having an excitation wavelength of the test subject, a fluorescence information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having a fluorescence wavelength of the subject, and a distance information acquirer for obtaining distance information between a position of the objective lens where the detection value of surface scattered light by means of the surface scattered light information acquirer is maximum and a position of the objective lens where the detection value of fluorescence by means of the fluorescence information acquirer is maximum, wherein the depth of the test subject within the sample is obtained based on the acquired distance information with a position on a surface of the sample as a reference.